Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces: A review

Time of flight-secondary ion mass spectrometry (ToF-SIMS) is a SIMS based surface sensitive technique that provide specific compound identification molecules. Recently, the importance ToF-SIMS has grown for characterization and utilization polymers, pharmaceuticals, semi-conductors. The specificity distinguishes it from other techniques such as X-ray photoelectron spectroscopy (XPS), Auger electron (AES), so forth, making preferred tool effective analysis polymers. purpose this review to elucidate capability effectively analyze chemistry polymer materials.